Electric Force Microscopy Mode (EFM) is an oscillating mode. A metal tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of the interactions with the gradient of electrical forces present on the surface.
Material science
Electronic material
Life science
Polymer science
Nanostructure
Electric Force Microscopy (EFM) measures electric field gradient distribution by measuring the electrostatic force between the surface and a biased AFM cantilever. It is used for electrical failure analysis, detecting trapped charges, mapping electric polarization, and performing electrical read…
Electrical characterization
Mapping of gradient electric field
High sensitivity of the phase signals and amplitude
Nano-Observer AFM microscope,
The best AFM
ResiScope II,
AFM Electrical Characterization
AFM Probes Shop,
Wide range of SPM probes
