Piezoresponse Force Microscopy mode (PFM) is a AFM contact mode. An electrical oscillation is applied to the conductive tip during scanning. Mapping piezoelectric orientation areas is carried out by measuring the amplitude of oscillation and the offsets of the phase signal.
Material Science
Piezoresponsive materials are substances that undergo mechanical deformation in response to an applied voltage. Piezoresponse Force Microscopy (PFM) enables high-resolution nanoscale characterization of this piezoresponsive materials.
high sensitivity of the phase signals and amplitide
Mapping piezoelectric field
Nano-Observer AFM microscope,
The best AFM
ResiScope II,
AFM Electrical Characterization
AFM Probes Shop,
Wide range of SPM probes
