Description
Tip Specifications | |
---|---|
Material | Si |
Height (μm) | 14-16 |
Coating | None |
Tip ROC | <10nm |
Cantilever Specifications | ||||
---|---|---|---|---|
Spring Constant (N/m) | Frequency (kHZ) | Length (μm) | Width (μm) | Thickness (μm) |
78 | 300 | 150 | 54 | 5.2 |
ACCESS-NC probes are sharp silicon probes that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface.
Tip Specifications | |
---|---|
Material | Si |
Height (μm) | 14-16 |
Coating | None |
Tip ROC | <10nm |
Cantilever Specifications | ||||
---|---|---|---|---|
Spring Constant (N/m) | Frequency (kHZ) | Length (μm) | Width (μm) | Thickness (μm) |
78 | 300 | 150 | 54 | 5.2 |
QUANTITIES PRICE | 10, 20, 50 |
---|---|
BACKSIDE COATING | None, Aluminium |