Description
Highly conductive diamond probes, formed by a unique patented process ensure the best possible wear and electrical performance. These tips are sharper and last longer than any other electrical AFM probe.
| Bulk Tip | |
|---|---|
| Tip Shape | 4 Sided Pyramid |
| Height | 12.5 ± 2.5 um |
| Front Angle (FA) | 25 ± 5 degrees |
| Back Angle (SA) | 15 ± 5 degrees |
| Side Angle (SA) | 22.5 ± 5 degrees |
| Tip Setback (TSB) | 15 ± 5 um |
| Diamond Tip | |
|---|---|
| Tip Shape | Cone |
| Radius | 10 ± 5 nm (AS) / < 5 nm (SS) |
| Height | 300 ± 100 nm |
| Tilt Angle | 0 ± 1 degrees |
| Material | Single Crystal Diamond |
| ½ Angle | 15 ± 2 degrees |
| Cantilever Specifications | |||||
|---|---|---|---|---|---|
| Length ± 10 µm | Width ± 5 µm | Thickness ± 0.5 µm | Frequency (kHz) | Spring Constant (N/m) | Tip Radius (nm) |
| 225 | 28 | 3.0 | 180 | 40 | 10 |
