Soft ResiScope mode is an intermittent AFM mode. The AFM probe only stays in contact with the sample during a short period of time with a constant force control which allows the ResiScope II to measure the resistance and the current in the best conditions for quantitative measurements. Then the tip is retracted and moves to the next step
Semiconductor
Polymer
Nanotubes
Organic materials
Nanostructure
I would like to download ResiScope Application Note :
Resistance and conductive measurements at the nanoscale appears as an essential technique for many AFM applications. Actually, all measurements are made in contact mode which is not an issue on hard sample like semiconductors… However for some samples, contact mode could be destructive like conductive polymers or biological samples. Soft ResiScope mode is an unique method to measure resistance and current on all kind of samples including soft samples.
True Quantitative Resistance/ Current Measurements with Intermittent Contact
UNIQUE Technology
NO Contact Mode
NO Friction
Constant Force = Quantitative Electrical Measurements
Nano-Observer AFM microscope,
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ResiScope II,
AFM Electrical Characterization
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