Description
TM190 probes have sharp silicon tip on a long silicon cantilever for imaging in Tapping/Non-contact modes. These probes are compatible with most commercial AFM’s in the market.
Tip Specifications | |
---|---|
Material | Si |
Shape | Pyramidal |
Height (μm) | 14-16 |
Tip ROC | <10 nm |
Cantilever Specifications | ||||
---|---|---|---|---|
Spring Constant (N/m) | Frequency (kHZ) | Length (μm) | Width (μm) | Thickness (μm) |
45 | 190 | 225 | 40 | 7.8 |