Magnetic Force Microscopy Mode (MFM) is an oscillating mode. A magnetic tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of interaction with the magnetic forces on the surface.
Semiconductor
Data storage
Material science
Magnetic Force Microscopy is an AFM mode that maps the magnetic force gradient on the sample surface. MFM can be used to image both naturally occurring or written domain structures in magnetic materials.
Study of magnetic materials
Mapping of magnetic field
High sensitivity of the phase signals and amplitude
Nano-Observer AFM microscope,
The best AFM
ResiScope II,
AFM Electrical Characterization
AFM Probes Shop,
Wide range of SPM probes
