Multiple AFM Modes
In addition to performance, the Nano-Observer is capable of several advanced modes wich expand your field of investigation. Beside contact/ LFM and Oscillating/Phase imaging, several modes are available to characterize mechanical viscoelasticity, adhesion of your samples as well as electrical properties (ResiScope, Soft ResiScope, CAFM), electric and magnetic fields (MFM/EFM) and surface potential (HD KFM ) .