Description
ANSCM probes are silicon probes with a thin layer of Pt/Ir coating on both re ex and tip sides of the probes. ANSCM probes with 2.7 spring constant are ideal for EFM and KFM applications and are available for use in CAFM mode.
| Tip Specifications | |
|---|---|
| Shape | Pyramidal |
| Height (μm) | 14-16 |
| Coating | Ptlr |
| Cantilever Specifications | ||||||
|---|---|---|---|---|---|---|
| Spring Constant (N/m) | Frequency (kHz) | Length (μm) | Width (μm) | Thickness (μm) | Tip ROC (nm) | Pt/Ir Thickness (nm) |
| 0.2 | 12 | 450 | 40 | 2.5 | 30 | 25 ± 5 |
