Description
CM28 probes are sharp silicon probes for contact mode imaging in air/liquid environments. These probes are compatible with most commercial AFM’s in the market.
Tip Specifications | |
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Material | Si |
Shape | Pyramidal |
Height (μm) | 14-16 |
Tip ROC | <10 nm |
Cantilever Specifications | ||||
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Spring Constant (N/m) | Frequency (kHZ) | Length (μm) | Width (μm) | Thickness (μm) |
0.1 | 28 | 225 | 46 | 1 |