Scanning probe microscopy for advanced nanoelectronics

July, 2019

Publication of Mario Lanza – Nature Electronics – Device & Materials Engineering
Nano-Observer AFM Microscope – CSInstruments

Scanning probe microscopy (SPM) refers to a family of techniques that can examine several mechanical, electronic, physical and chemical phenomena at the nanoscale, as well as perform local modification of materials. However, their potential for nanoelectronics research could be further extended. In this perspective article we foresee future SPM-based developments that could lead to unique nano-fabrication and nano-characterization experiments.

NanoFluid Based on Glucose-Derived Carbon Dots Functionalized with [Bmim]Cl for the Next Generation of Smart Windows

June, 2019

Publication of Helena M. R. Gonçalves,* Rui F. P. Pereira, Emmanuel Lepleux, Thomas Carlier, Louis Pacheco, Sónia Pereira, Artur J. M. Valente, Elvira Fortunato, Abel J. Duarte, and Verónica de Zea Bermudez*
Nano-Observer AFM Microscope – CSInstruments

The design of new advanced materials and technologies is essential for the development of smart windows for the next generation of energy-efficient buildings. Here, it is demonstrated that the functionalization of glucose-derived carbon dots with 1-butyl-3-methylimidazolium chloride results in a self-standing, water-soluble, viscous, reusable nanofluid with self-improving conductivity, thermotropy around 30–40 °C, and ultraviolet blocking ability. Its synthesis is straightforward, clean, fast, and cheap…