Soft Intermittent Contact Mode
ResiScope under temperature control
ResiScope (Conductive) AFM measurement on VO2 under temperature control from 25 to 50°C
High resolution
C36 molecules – 500 nm – Resonant mode
HD-KFM mode
Graphene on Si – HD-KFM mode – Surface Potential signal – 8µm
Magnetic Lateral Field Microscopy
Circular DNA on mica
Circular DNA on mica, topography signal, 2µm scan
Affordable AFM at Your Fingertips
AFM microscope Trade-In
EZ Temp
Precise temperature & imaging during temperature changes (-35°C to 250°C)
Temperature : 70°C to 40°C, Resonant mode, PCL (polycaprolactone) crystallization under controlled temperature, Scan size : 20µm
Environmental control
Low noise laser & electronics
Quality of measurements
No interference, Pure deflection signal,Better resolution (imaging and force curves)
Easy approach with side view
Sample/tip visibility, Ease of use, Avoids damaging sample or tip, Better contrast by lateral illumination
Pre-Alignment tip/laser
Allow to keep tip/sample position
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- AFM Trade-In Operation 29 January 2018